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Cross sections for ionization-assisted electron knock-on damage of hBN

Toma Susi, University of Vienna
Posted 25 days ago

scanning transmission electron microscopy (STEM) images showing an hBN sample at different magnifications. Plot of reduction of the displacement threshold energy as a function of charge constrained on the ejecting element. Plot of displacement cross sections for boron.

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POSTED BY: Toma Susi
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